Nikon Binocular Serial Number Lookup

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Contents Retrieved from Microscopy Listserver Archives Dear Jondo, we are using the PIPS for several years already and I have to admit that we cleaned the inner surface of the work chamber only in.very. long intervals. This is only necessary if flakes of sputtered material beginn to build and it has not to be a 'perfect' cleaning process. Of course, you need to clean from time to time the viewing window, the guns, the penning gauge and the shutter.

  1. Nikon Binocular Serial Number Lookup

If you have a vacuum problem, it is more likely that one of the o-rings in not OK. The most probable one is of course the rotating seal of the specimen mount. It should be cleaned and lubricated about every 50 hours of use. Furthermore I can only encourage you to seek help from your local Gatan representative. At least the people from Gatan Germany never left us alone with our occasional problems and questions about the system and came up with help and solutions readily (hello Herr Nitschke, do you read this?:) Petra Usual disclaimer: I have no interest or relation to Gatan other than being a very satisfied customer.

At 12:21 01.10.99 +0900, you wrote: Dear members: I have used PIPS ion beam thinner for a month or so. Vacuum level became bad and I could not turn on the gun. When I opened up the chamber, I found that metal parts were contaminated severely. It seemed that it was time to clean up the parts.

I tried to clean them with tissue paper and alcohol. They were hardly removed. Especially when the metal surface had a machining marks such as concentric circular grooves, it was more difficult. Some parts I could take out of chamber and clean.

The other parts, I could not take out because they were stationary. I have to clean them in a state of being equipped. I am afraid to use organic solvent which would remain in the chamber and make the vacuum worse. My question is how I can clean the contamination easily. Could any of you give me help out of your good experiences? Help from Gatan expert would also be appreciated.

Jondo Yun Center for Instrumental Analysis Kyungnam University 449 Weolyeong-dong, Masan, 631-701, Korea 82-551-249-2697 (tel) 82-551-248-5033 (fax) jdyun-at-hanma.kyungnam.ac.kr - Dr. Petra Wahlbring Centre de Recherche Public - Gabriel Lippmann Laboratoire d'Analyse des Materiaux (LAM) 162a, av. De la Faiencerie L-1511 Luxembourg tel.

+352-466644-402 fax +352-466644-400 e-mail: petra.wahlbring-at-crpgl.lu Visit our WWW site! Contents Retrieved from Microscopy Listserver Archives This position is for a technician in the Intel Fab 12 Materials Lab TEM group who will be responsible for TEM sample preparation. This job requires working with engineers to develop a sample preparation strategy and taking that task to completion. TEM sample preparation requires a high degree of manual skill, judgment, dexterity, hand-eye coordination, steady hands and good eyesight. The position requires operating precision mechanical sectioning and polishing equipment (tripod polisher and dimpler), focused ion beam (FIB) tools, and Ar-ion milling tools. High power optical microscopes and dual-beam FIBs are used to determine precision cross-section locations.

TEM samples are extremely fragile and require extreme care and good manual dexterity during handling. Auxiliary duties will also include general upkeep of the TEM group labs, developing and printing TEM film and labeling TEM prints. The ideal candidate will have a 2-year college or technician degree in a science or engineering field and no less than 2-3 years experience operating TEM sample preparation equipment. The candidate will have worked in an area where manual dexterity, independent operation and decision making have been demonstrated. Familiarity with semiconductor process technology is also highly desirable. Intel is an equal opportunity employer.

Resumes accepted by fax, email, or snail mail. Interested candidates should contact: David Howell FAB 12 TEM Engineer Intel Corporation M/S OC2-218 4500 S. Dobson Rd Chandler, AZ dave.fab12.howell-at-intel.com Fax (480)-715-8363. Contents Retrieved from Microscopy Listserver Archives DVD Player Blowout!!!

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You will be removed from this list at any time by following the simple instructions that can be found at the end of this email. To be removed from our list, reply to this email and type remove in the subject line. Contents Retrieved from Microscopy Listserver Archives Hi, I'm pretty new at LM and I am trying to characterize components of seed cell walls. Does anyone know of stains that I could use to differentiate, say, celluloses from hemicelluloses from pectins etc.? I saw a really nice picture in a text once where different components were fluorescing at different colors, but I can't find the book now.

Also, if anyone knows of references to such experiments, I would be very grateful. Thank you, Dana Stewart Masters Student, Simon Fraser University British Columbia djstewar-at-sfu.ca. Contents Retrieved from Microscopy Listserver Archives Dear Future Associate, You Can Work At Home & Set Your Own Hours. Start earning Big Money in a short time NO Newspaper Advertising! Your job will be to stuff and mail envelopes for our company.

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Contents Retrieved from Microscopy Listserver Archives Low Vacuum and Environmental Scanning Electron Microscopy, LV-ESEM= '99 October 19-21, 1999, Chalmers University of Technology, Gothenburg,= Sweden This course will be given in collaboration with four microscope manufacturers (Hitachi, Jeol, Leo, Philips/Fei) and suppliers of= equipment for EDX and EBSP. The aim of this 3-day intensive course is to give a theoretical background in the morning sessions and experimental insights in the afternoons.= The lectures and the demonstrations will be given by application specialists from the different companies representad at the course and also by researchers working with LV- and ESEM. The demonstrations and lab= classes will be carried out on equipment brought to Chalmers specifically= for this course. =20 Detailed information about LV-ESEM '99, including course programme= and registration form, is posted on: Course organisers: Lena Falk (lklfalk-at-fy.chalmers.se) and Mats Halvarsson (mats.halvarsson-at-fy.chalmers.se) Associate Professor Lena Falk Department of Experimental Physics, Chalmers University of Technology, SE-412 96 G=F6teborg, SWEDEN tel: +46 31 772 3321 fax: +46 31 772 3224 e-mail: lklfalk-at-fy.chalmers.se =20. Contents Retrieved from Microscopy Listserver Archives Attn all RCA-o-philes, With regard to Jim Darley's citing of the High Crimes in the Diet of Dogma Court Record.

Hello List Readers: Laura Rhoads suggested that forced use of THAT instrument would be a suitable penalty for those committing 'crimes' such as broadcasting 'dogma'. I concuredadding 'I would not want to offend anybody, but I've been in purgatory for two years already.

Circa 1970 that instrument was the worst money could buy in the Western World.' Yes, that instrument looked good, it had a big column and would make a fine statue in someone's garden (so Laura suggested, personal communications). I would love one, it would be the crowing glory to the banks of the Ross River.

Jim- You've got it all wrong: I said lawn ornament, not garden. If I put an EMU-4 column and requisite support pedestal in my garden there would be no room for my radishes. Actually, someone has already offered me an RCA EMT for this purpose, but that model isn't nearly massive enough for what I intend (I think it's complete so if anyone wants this artifact say, for a home workshop restoration project, contact me off-list). Actually, the subject of RCA-for-pillory has brought up some rather interesting interpretations regarding the application of RCA EO equipment. Since I had yet to enter kindergarten by the time the last EMU-4 rolled off the assembly line in 1969 I never had the opportunity many others seem to have had cutting their teeth (I was cutting my own) on this (at the time) cutting edge technology. Missing this equipment in its prime, I feel somehow cheated, and as a result will have to rely on the experiences of those who did. What I find really interesting is the disparate variety of opinions as to service and operation.

Could the EMU-4 Jim used at the World Expo have been a made on a Monday and Chuck Garber's, for example, a Wednesday? Or, did the RCA engineers install some extra parts they found in Hangar 18 from the Roswell, NM Crash Site that Jim's didn't get?

Since the SPI rig is still running perhaps the operators can comment on their filament life and if it exceeds 12 hours? In order to solve the poor vacuum pumping problem (and to avoid forced coffee breaks) has this unit's vacuum system been retrofitted with a Balzers turbo pump perhaps? Are the alignment problems vividly recalled simply the result of using the wrong size mallet maybe? All these issues are quite intriguing.

If anyone does look into the history of RCA then maybe other manufacturers of EO equipment, such as Siemens, would be in order as well? And who was Vacuum Generator of the UK? Those who forget the past are doomed to repeat its failures. It seems that the technical information is available, and MSA has a tremendous body of institutional memory. It would be a shame to have this collective wisdom disappear.

For that matter, when I arrived at my latest job I discovered a complete Philips 75C hidden in the corner of the basement, with original warranty card (never filled out) which I am told still operates.Where will I ever get parts?. If the iron dice must roll, may God help us all. Theobald von Bethmann-Hollweg German chancellor, August 1, 1914. Laura Rhoads Biology Department SUNY Potsdam Potsdam, NY 13676 315-267-2260 315-267-3170 fax. Contents Retrieved from Microscopy Listserver Archives Two two-year PostDoctoral Fellowships are available in the Department of Materials, Oxford, UK.

Please note that the closing date for applications is very soon: OCTOBER 7 1999. For further details please contact Professor John Titchmarsh at: john.titchmarsh-at-materials.oxford.ac.uk Tel +44 1865 273707 Fax +44 1865 283333. 1. Postdoctoral Fellowship in Radiation Damage A 2-year postdoctoral research fellowship is available to characterise radiation damage induced by neutron irradiation in model alloys and ferritic steels through the use of advanced transmission electron microscopy.

The project aim is to determine the nature and the compositional dependency of the damage and, hence, to contribute to the understanding of the decrease in fracture toughness with neutron exposure in RPV steels. The successful candidate will work closely with industrial collaborators during the course of the project.

Please quote ref: JMT1 in any correspondence. The project requires the systematic examination of specimens from a range of model alloys subjected to different thermal and irradiation treatments to characterise the matrix damage present in the form of point defect clusters and dislocation loops, using weak beam analysis in energy-filtered images. In addition, possible interactions between point defects and alloying elements will be explored using analytical methods including: core-loss imaging, electron energy-loss spectroscopy and EDX analysis. The Department of Materials operates a range of electron microscopes including a JEOL 3000F FEG-TEM with GIF and EDX, an HB501 dedicated FEG-STEM and 400keV HREM instruments. The successful applicant will join a rapidly growing group of post-doctoral and postgraduate students engaged in microstructural and chemical characterisation of a wide range of materials using electron microscopy. The successful candidate will possess a PhD in a materials science, physics or materials engineering field, be able to work within a group and be able to liase with industrial collaborators.

Experience using transmission electron microscopy for the characterisation of crystal defects is essential. 2. Postdoctoral Fellowship in SCC/Electron Microscopy A 2-year postdoctoral research fellowship is available to develop the use of analytical transmission electron microscopy methods to investigate environmentally assisted cracking (EAC) in austenitic stainless steels, in collaboration with Rolls-Royce Marine Power. Please quote ref: JMT2 in any correspondence.

The post concerns: (i) the development of specimen preparation techniques for generation of electron-transparent foils from materials containing cracks; and (ii) the systematic examination of a series of materials of selected compositions in which EAC has been induced in aqueous environments under controlled stress, temperature, environmental chemistry and corrosion potential. Characterisation will be performed using a range of electron optical equipment including a new JEOL 300kV FEG-TEM and an HB501 FEG-STEM. The applicant will join a rapidly growing group of post-doctoral and postgraduate students engaged in structural and chemical characterisation of a wide range of materials using electron beam methods. Candidates should possess a PhD in a materials science, physics or materials engineering field, be able to work within a group and be able to liase with industrial collaborators. Contents Retrieved from Microscopy Listserver Archives Hello, We obtain our EM images using 35mm film.

Each roll of film normally has about 60 images. We would like to eliminate the cost of printing these images and work with digital images. We have considered cutting our rolls of negatives into short strips and scanning them on a flatbed scanner.

We have rejected this idea because of the time needed to digitally cut and save each individual image from the huge original image. We have also considered cutting our rolls into 6 image strips and scanning them with a film scanner.

We have rejected this idea because the only film scanners we have found can only read strips with a maximum of 6 images making it necessary to load a new 6 image strip every few minutes. Again not a very efficient method. Does anyone know of a film scanner that will read 35mm strips of 20 or more images or have some other idea how to automate the scanning of our negatives? Basgen Department of Pediatrics University of Minnesota Box 491 420 Delaware Street SE Minneapolis, MN 55455 Phone: 612-625-7979 FAX: 612-626-2791 E-mail: basgen-at-tc.umn.edu.

Contents Retrieved from Microscopy Listserver Archives The Center for High Resolution Electron Microscopy at Arizona State University has an open position for a Research Specialist. The Center provides electron microscopy resources for the university and external community, including a range of transmission and scanning electron microscopes, as well as specimen preparation facilities. The successful applicant will be expected to assist with the day-to-day operation and maintenance of microscopes within the Center. Primary instrument responsibility will include but not be limited to the JEOL 2000FX transmission electron microscope (TEM), the JEOL 840 Scanning EM, and the soon-to-be acquired JEOL 5900 SEM with liquid-helium CL system.

Other tasks will include training and supervision of researchers in proper use of the instruments, including observance of safety procedures, and authorization of users. Some limited opportunity to assist and advise researchers in designing and carrying out experiments, including active participation and collaboration in experiments with data collection and analysis as required. Minimum qualifications: Bachelors or Masters degree or equivalent training in Physical or Materials' Sciences or closely related discipline, with at least three but preferably five years' additional experience with operation and maintenance of scanning and/or transmission electron microscopes. Experience with design, construction and testing of electronic circuitry, and knowledge of vacuum systems would be desirable.

Application deadline: October 15, 1999, or until position filled. Arizona State University is an equal opportunity employer. Women and minorities are encouraged to apply. Send resume and the names and addresses of three references to John Wheatley.

Please contact John via one of the following ways-preferably e-mail: John C. Wheatley, Lab Manager Arizona State University Center for Solid State Science Tempe, AZ Phone: (480) 965-3831 FAX: (480) 965-9004 John.Wheatley-at-ASU.Edu John C. Wheatley Lab Manager Arizona State University Center for Solid State Science PSA-213 BOX 871704 Tempe, AZ Phone: (480) 965-3831 FAX: (480) 965-9004 John.Wheatley-at-ASU.Edu.

Contents Retrieved from Microscopy Listserver Archives In my earlier message I didn't make myself clear about what I actually need. The bean counters here are wanting to raise the rates that we charge in-house people to use the equipment and to provide technical help to those who need it. I need to know what other state facilities charge for these services to justify our raising our rates or keeping them where they are. Thanks for your help. Donna Wagahoff SIU School of Medicine PO Box 19627 Springfield, IL 217-782-0898 fax 217-524-3227. Contents Retrieved from Microscopy Listserver Archives Hi, To get an idea about the fee structure (to be revised soon) CIMC uses for services within our university, please visit our website and go to the fees page. (- I think this question is asked frequently but I haven't been able to locate any responses in the archives.

I need to know what other labs charge for using the various pieces of equipment in your lab and for technical services performed by lab personnel. Thanks for your help. Donna Wagahoff SIU School of Medicine PO Box 19627 Springfield, IL 217-782-0898 fax 217-524-3227.

M.V. Parthasarathy Prof.

Of Plant Biology, Adjunct Prof. Of Biomedical Sciences (Vet), & Director, Cornell Integrated Microscopy Center (CIMC) Section of Plant Biology 228 Plant Science Building Cornell University, Ithaca, NY 14853 E-Mail: mvp2-at-cornell.edu Plant Biology Office: 268 Emerson; Telephone: 607-255-1734 Plant Biology Fax: 607-255-5407 CIMC Office: C1 054 Vet. Center; Telephone: 607-253-3803 CIMC Office Fax: 607-253-3803 CIMC web site: http://www.cimc.cornell.edu. Contents Retrieved from Microscopy Listserver Archives Good morning, Microscopists- Hope this is the start of a great new week for everyone! My question today= is again delicate, but in a different way. I'm not even sure that it can be answered directly given a previous thread on commercialism, price fixing, undercutting the private sector with taxpayer funded instrumentation, unfair competetion on other levels, etc., but I'm going to ask anyway and bravely accept any criticism or flames if I don't phrase it correctly. I hope I'm= not exasperating anyone.=20 We have a Balzer's HPM010 high pressure freezer in our facility, one of= about 10 in the US if I'm not wrong.

I actually know that there is a user's group out there, but a HD crash a bit back removed all my files on that, so I'll use= the list at least once to ask my question. I realize that MOST other labs must charge all users for instrument use based on beam time, number of cycles, or some such. We may be unique in that we do not charge anyone except off= campus or out of system users for our equipment.

Each user supplies all= comsumables, the facility Supervisor and manager (me) are line items in our department's budget, and our service contracts are supported by our serviced departments, the College, and the Vice-provost for research. We consider ourselves extremely lucky not to have to charge for use of the lab so that even unfunded people can work here if they can get supplies and we don't have to do the billing and accounting associated with charges. We diligently try to maintain excellent relations with the commercial EM labs around our area and refer all business to them if they have the facilities to perform it.

Hence, we don't have much experience in setting prices for users that we can charge. How do the rest= of you decide on these charges? I have met with our comptroller's office (a couple of years ago when we were looking at charging fees like all the rest of the labs on campus) and understand that if you charge anyone with a government contract or grant, you must bill EVERYONE, even for teaching time, and that the cost to grantees or contract=A0 holders must be billed at the lowest rate.= Costs must be neutral - that is, no profit and all actual costs recovered, which means a lot of research into just what those costs ARE. It is very difficult for an essentially one man band to do all this stuff and it was decided to leave us alone as we are for now.=20 Hence, my problem. (FINALLY).=A0 Can I get some idea of what others charge= for High Pressure Freezing=A0 without making every service provider out there= angry and being accused of unfair competition? Or do I just guess for a one time industrial user who may not really want what we can do, anyway? I have, in= the past, charged $5 per 'shot' plus a Dewar of liquid nitrogen at cost to cover expendibles and time, this to outside but not for profit users - these were visiting scientists from around the world and here in state.

I'm not sure= this actually covered our costs.=20 Any help or guidance would be useful and appreciated. Any criticism of my= post (to include spelling or attitude) will be greatfully received and= considered. Thanks in advance. Sharp Arizona State University Dept. Plant Biology, box 871601 Tempe, AZ Phone - (480)-965-3210 Fax - (480)-965-6899 =20. Contents Retrieved from Microscopy Listserver Archives Dear Listserver Members, I am faced with my frequent dilemma of trying to look at a sample= I have never seen before, and one that my customer has either never imaged before or has not provided images of the desired features.

Has anyone ou= t there ever imaged the materials used in soft contact lens in the SEM before? If so, are there any things that might help to either enhance or preserve the fine structure of the material they are made from?

I am happ= y for any suggestions or advice. Thanks in advance for any input. Contents Retrieved from Microscopy Listserver Archives Hi I'm in the process of fitting the factory optical microscope onto an 840A, and I don't have any info on the various cable connections. 1 There are two cables issuing from the mounting flange: - one with a BNC plug, cable labelled 'OM1' - one with a 5-pin plug, cable labelled 'BE8' 2 There's one cable issuing from the elbow, with a 5-pin plug, and a smudged label. 3 On the elbow, there's a 5-pin socket, also what looks like a little green indicator light.

I will be very grateful to whoever can explain what all of these are for (they are in addition to the 5-pin plug from the illumination lamp base). Also, does the secondary electron imaging still work with the OM fitted? Presumably the latter has to be thoroughly retracted.

Thanks Ritchie Ritchie Sims Phone: 64 9 3737599 ext 7713 Department of Geology Fax: 64 9 3737435 The University of Auckland email: r.sims-at-auckland.ac.nz Private Bag 92019 Auckland New Zealand. Contents Retrieved from Microscopy Listserver Archives Hi, Some fifteen years ago I ran a course for a contact lens manufacturer where we modified their microscope (SEM) to look at the wet lens. They had an old ISI SEM but complete with a Robinson BSE detector. As the SEM had a 'proper' vacuum system, with a manifold leading from the DP to the specimen chamber and gun area, we were able to modify the system to be pseudo VP; I have to say in those days we just called it common sense! We placed a rubber bung (stopper to some) in the rear pumping line of the specimen area. The bung had a 0.5cm (3/16th inch) hole in it. Switching OFF all voltages to the SE (Everhart Thornley) detector we than ran in backscatter for about 20 minutes each session, by which time the lens would start to curl.

We did not fix the lens down simply placed it on a 1 1/.4 inch stub. The porosity in the lens was very clear under these conditions. Hope this helps? Steve Chapman Senior Consultant E.M. Protrain, 6 Hillcrest Way, Buckingham Industrial Park, Buckingham MK18 1FU, England Tel & Fax 44 (0)1280 814774 E-mail - protrain-at-emcourses.com Web Site - For Consultancy and Courses in Electron Microscopy World Wide Courses available in - Australia, Canada, Europe, South Africa, New Zealand, Taiwan, United States, United Kingdom.

Contents Retrieved from Microscopy Listserver Archives Greetings, I am in the market to buy a stereo microscope with a price of up to about $3000. One major use of the microscope will be to examine snail shells for defects at high magnifications, so as good a resolution as $3000 can buy is the major criterion.

The two lines I am considering are the Olympus SZ & the Leica GZ series. I don't have the means of personally testing different models. I will appreciate comments from those who have used these models on the optics, mechanics & any other aspect of these microscopes. Aydin Orstan. Contents Retrieved from Microscopy Listserver Archives Greetings, I am in the market to buy a stereo microscope with a price of up to about $3000. One major use of the microscope will be to examine snail shells for defects at high magnifications, so as good a resolution as $3000 can buy is the major criterion. The two lines I am considering are the Olympus SZ & the Leica GZ series.

I don't have the means of personally testing different models. I will appreciate comments from those who have used these models on the optics, mechanics & any other aspect of these microscopes. Aydin Orstan. Contents Retrieved from Microscopy Listserver Archives Dear ListServers: Looking at the post of Michael D. Frey, about sample preparation for contact lens, I reflexioned that this is a very good place to ask you all ideas for service with SEM, This is the unique SEM in our State, even I know that only there is another one in Southeast Region of Mexico, including our neighboard country of Guatemala. So I would like to extend my work in investigation assistance in Biology Science, to another services to customers for different aplications.

I«ve known some forensic applications, but I also know that this services needs besides me, to operate the SEM, one expert who knows what to look at the sample. Your opinion will be very helpfull to solve this dilema of how to offer services to customers Best regards MC.

Guadalupe Nieto L—pez Laboratorio de Microscop’a Electr—nica ECOSUR Unidad Tapachula Carr. Antiguo Aeropouerto Km 2.5 30700 Tapachula, Chiapas, Mexico. (962) 81077, 81103 Fax. Contents Retrieved from Microscopy Listserver Archives We would like to buy immediately used GIFs for 300kV and 120kV TEMs. Marek Malecki, M.D., Ph.D. Director and Principal Investigator Molecular Imaging Laboratories (MIL) and Department of Biology University of California at San Diego address: 1500 Bonner Hall, University of California at San Diego 9500 Gilman Drive, La Jolla, CA telephone - lab: telephone - office: pager: fax: email: mmm-at-ucsd.edu www site: http://mil.ucsd.edu. Contents Retrieved from Microscopy Listserver Archives Attention all Balzers Freeze Fracture Folk: Need some extra stages?

Always wanted to do complimentary replicas? Now's your chance. I've gotten out of the freeze fracture business and put my old Balzers Turbo out to pasture. I did, however, save a hoard of parts which someone might put to good use. Contents Retrieved from Microscopy Listserver Archives We would like to buy immediately used GIFs for 300kV and 120kV TEMs.

Marek Malecki, M.D., Ph.D. Director and Principal Investigator Molecular Imaging Laboratories (MIL) and Department of Biology University of California at San Diego address: 1500 Bonner Hall, University of California at San Diego 9500 Gilman Drive, La Jolla, CA telephone - lab: telephone - office: pager: fax: email: mmm-at-ucsd.edu www site: http://mil.ucsd.edu. Contents Retrieved from Microscopy Listserver Archives Dear David, I have looked at a soft contact lens before, but just in the dried state. I just stuck it on a stub and gold coated it. Since they are normally 55% water, I wouldn't vouch for the stucture in this state. Being smooth jelly, I don't think they have much surface structure. At 03:23 PM 10/4/99 -0400, you wrote: Dear Listserver MembersI am faced with my frequent dilemma of trying to look at a sample I have never seen before, and one that my customer has either never imaged before or has not provided images of the desired features.

Has anyone out there ever imaged the materials used in soft contact lens in the SEM before? If so, are there any things that might help to either enhance or preserve the fine structure of the material they are made from? I am happy for any suggestions or advice. Thanks in advance for any input. David Frey Regards, Mary Mary Mager Electron Microscopist Metals and Materials Engineering University of British Columbia 6350 Stores Road Vancouver, B.C. V6T 1Z4 CANADA tel: 604-822-5648 e-mail: mager-at-interchg.ubc.ca.

Nikon binocular serial number lookup

Nikon Binocular Serial Number Lookup

Contents Retrieved from Microscopy Listserver Archives At 11:20 AM 10/5/99 -0500, you wrote: - The Microscopy ListServer - Sponsor: The Microscopy Society of America Hi Rosemary, We have a BALZERS BAF060 freeze fracture machine. This is the newest model of this kind of instrument. Please chcke our web site (for more information. Ya Chen Scientist EM Facility Dept. Of Genetics, Cell Biology, and Development University of Minnesota Medical School 6-160 Jacson Hall 321Church St.

Minneapolis, MN 55455 Tel: 612-624-4652 FAX: 612-626-4173 yachen-at-mail.ahc.umn.edu http://www.cbc.umn.edu/em/. Contents Retrieved from Microscopy Listserver Archives Photoshop processing can help, but the place to start is in scanning. If you have a 30-bit or better yet a 36-bit (color) scanner, you should be able to manipulate the scanner's tone controls (black, white, and gamma) to optimize the scanner's 8-bit (grayscale) output. You might also try superimposing a neutral density filter on the film negative to match the work density to the scanner's range. The filter can be another piece of light-exposed and developed TEM film.

It just needs to have a uniform (gray) background. Always scan TEM negatives as positive transparencies; then invert the contrast in the scanner or Photoshop. A work-around, especially if you don't have a good scanner, is to print the negative in the darkroom to get the contrast and density you want and then scan the print. To further adjust the tonal quality in Photoshop, use Levels or Curves adjustment layers rather than applying these commands directly.

This will avoid much of the data loss in applying multiple corrections. Use the Multiply blending mode to increase the contrast from a light negative, and apply as many layers as needed to get the contrast and background brightness right for your printer. If you use unsharp mask filtering (highly recommended after scanning) and background leveling, apply these to layers before the tonal adjustments. Learning to use Layers in Photoshop takes some time, but is highly worthwhile. Larry Thomas Larry Thomas Pacific Northwest National Laboratory MSIN P8-16 P.O.

Box 999 Richland, WA 99352 Phone: (509)372-0793 Fax: (509)376-6308 Email: mailto: Larry.Thomas-at-pnl.gov From: Donald Delaney Sent: Tuesday, October 5, 1999 6:49 AM To: microscopy-at-Sparc5.Microscopy.Com Subject: Photoshop Negative Processing - The Microscopy ListServer - Sponsor: The Microscopy Society of America To Subscribe/Unsubscribe - Send Email to ListServer-at-MSA.Microscopy.Com On-Line Help -. I have some negatives taken on the TEM which developed extremely light.

I was wondering if anyone knows any tricks on photoshop for generating good quality prints. I typically adjust the levels and condense the size of the picture, but I am still not completely happy about the quality of the prints. Contents Retrieved from Microscopy Listserver Archives Dear Listers: I am running an SEM in the Geoscience Department at UNLV. I have been approached by a member of the biology department, who would like to image bacteria, the CaCO3 crystals deposited by the bacteria and if possible the substrate. The bacteria are fixed in glutaraldehyde. Does someone out there have a simple protocol for preparation and coating of these types of samples. I would like to apologize in advance for asking such a simple question, but I am only a geologist.:) Thank you in advance, Sarah.

Sarah A. Lundberg Microbeam Facility Analyst Office (702) 895-1134 University of Nevada, Las Vegas Lab (702) 895-2660 4505 Maryland Parkway Box 454010 email lundberg-at-nevada.edu Las Vegas, NV Fax (702) 895-4064 Home: 4489 De Forest Street Las Vegas, NV 89103 (702) 871-9635.

If you are a diehard Nikon optics aficionado—serious enough to want to be one of only a handful of people worldwide to own a particular model—then you’ll want to take a look at these exclusive 100th Anniversary Limited Edition binoculars, which include the iconic 8x30 EII and the recently introduced, hand-built WX 7x50 IF and 10x50 IF models. Since its introduction nearly 40 years ago, the 8x30 E Series has become one of Nikon’s best-selling binoculars, and are recognized as “the standard” among Nikon binocular fans. An updated 8x30 “EII” model was introduced during the late 1990s and continues to sustain popularity. While maintaining the optics and magnesium-alloy body design of the current 8x30 EII, the 100th Anniversary Edition offers an exclusive metallic grey body color with 100th Anniversary logo imprinted on the objective side, special 100th Anniversary Edition neckstrap and case and a distinct product package design with 100th Anniversary logo sticker affixed. Production of the 8x30 EII 100th Anniversary binocular will be limited to just 400 worldwide. MSRP: $799.95 WX 7x50 IF and 10x50 IF Now, if your wallet is deep and you want to be part of something with even more exclusivity, only 100 (combined total) of the Anniversary Edition WX 7x50 IF and 10x50 IF binoculars are being offered. Here are some of the features that make these hand-built binos so spectacular: A super-wide field of view and a Field Flattener Lens System compensate for curvature of field across the entire field of view.

This means that the sharp image obtained at the center of the field of view continues all the way to the periphery. Additionally, the WX series employs Abbe-Koenig prisms that feature total reflection on all surfaces, and provide a high light transmission rate. High-quality multi-layer coating, featuring uniformly high light transmittance across the entire visible range, is also applied to all lenses and prisms to realize a clearer, more natural view. Also, three ED (Extra-low Dispersion) glass elements employed in each tube compensate for chromatic aberration that can cause color fringing, realizing a contrast-rich and high-resolution view.

A WX binocular exclusive tripod adaptor (TRA-4) and hard case are also supplied. Both models come engraved with 100th Anniversary limited edition serial number, the Nikon 100th Anniversary logo on the binocular body and a commemorative leather strap embossed with 100th Anniversary logo designed for the WX models. Again, the WX 100th Anniversary Edition is restricted to just 100 total production of both models combined. MSRP: $5,999.95 for the 7x50 and $6,399.95 for the 10x50 model. For more information visit.